CMP/Display > CMP > Product Introduction
 
 
 
System Configuration
Dimensions 2100 x 3300 x 2400 (W x L x H)
Footprint
6.93§³ Weight 5.2 ton
Applicable Thin Film oxidized and metal thin films
Throughput(2 min polish) 45ea
Motor Current EPD System
In-line Metrology System
In and Ex-situ Pad Conditioning
Motor Feedback and Interlock
Grinding Process
Specifications
- Grinding speed ¡Ã 3000 A/min (TEOS. W)
- Grinding Uniformity ¡Â 5.0%(1¥ò)
- Grinding Reproducibility ¡Â 2.0%(1¥ò)
- Pollutant Particle ¡Â 25ea(SP1 6420, @0.2§­
- Scratch ¡Â 10 ea.(AIT)
 
 
System Configuration
Dimensions 2310 x 3600 x 2500 (W x L x H)
Footprint
8.28§³ Weight 6.8 ton
Applicable Thin Film oxidized and metal thin films
Throughput(2 min polish) 68ea
Motor Current EPD System
In-line Metrology System
In and Ex-situ Pad Conditioning
Motor Feedback and Interlock
Grinding Process
Specifications
- Grinding speed ¡Ã 3000 A/min (TEOS. W)
- Grinding Uniformity ¡Â 5.0%(1¥ò)
- Grinding Reproducibility ¡Â 2.0%(1¥ò)
- Pollutant Particle ¡Â 25ea (SP1 6420, @0.2§­
- Scratch ¡Â 10 ea.(AIT)
 
 
System Configuration
Dimensions 2100 x 4000 x 2500 (W x L x H)
Footprint
8.4 §³ Weight 7.3 ton
Applicable Thin Film oxidized and metal thin films
Throughput(2 min polish) 70ea
Motor Current EPD System
In-line Metrology System
In and Ex-situ Pad Conditioning
Motor Feedback and Interlock
2 or 4-step grinding
Grinding Process
Specifications
- Grinding speed ¡Ã 3000 A/min (TEOS. W)
- Grinding Uniformity ¡Â 5.0%(1¥ò)
- Grinding Reproducibility ¡Â 2.0%(1¥ò)
- Pollutant Particle ¡Â 25ea(SP1 6420, @0.2§­
- Scratch ¡Â 10 ea.(AIT)